Agilent Technologies 16760Aの取扱説明書

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  • Agilent Technologies 16760A - page 1

    Agilent T echnologies 16760A Logic Analyzer Help V olume © 1992- 2002 Agi lent T echnologie s. All rights reserved . ...

  • Agilent Technologies 16760A - page 2

    2 Agilent T echnologies 16760A Logic Analyz er The Agi lent T echnolo gies 16760A 1500 Mb/s Sta te/800 MHz T iming logic analyzer offe rs 64 M deep memory with up to 170 channels on a single ti me base (5 cards, 34 channe ls per card). Differen tial probing captures input signals as low as 200 m V p-p. “Gettin g Started” on page 13 • “Probi ...

  • Agilent Technologies 16760A - page 3

    3 Agilent T echnologi es 16760A Logic Anal yz er • “Edi ting th e T rigg er Se quen ce (T i min g or 200 , 400 Mb/s Sta te On ly)” on page 78 • “Edi ting Ad vanced Trigger Funct ions ( T im ing or 2 00 Mb/s State On ly)” on page 83 • “Saving/Re calling T r igger Setups” on page 90 • “Ru nning M easu rements” on page 9 1 • ...

  • Agilent Technologies 16760A - page 4

    4 Agilent T echnologie s 16760A Logic Analyzer See Also Main System Help (see the Agilent T echnologies 16700A/B-Series Logic Analy sis Sy stem help volume) Glossary (see page 263 ) ...

  • Agilent Technologies 16760A - page 5

    5 Contents Agilent Technologies 167 60A Logic Analyzer 1 Getting Started Probing and Sam pling Mode Selection Steps 15 Step 1. Connect lo gic analyzer to the device under te st 15 Step 2. Choose the sam pling mode 16 Step 3. Format la bels for the pro bed sign als 19 Timing Mo de or State Mode Steps 22 Step 4. Define th e trig ger con ditio n 22 St ...

  • Agilent Technologies 16760A - page 6

    6 Contents Choosing the Sam pling Mode 43 Selecti ng the T iming M ode (A synchron ous Sam pling) 43 Selec ting the State Mod e (Synchron ous Sampli ng) 46 In Eith er T iming M ode o r Stat e Mod e 53 Selec ting the Eye Scan Mode 55 Formatting Labels for Logic Analyz er Probes 57 To as sign pods to t he anal yzer 5 7 To set pod thr eshold voltages ...

  • Agilent Technologies 16760A - page 7

    Contents 7 Using Sy mbols 101 To load object file sy mbols 10 2 To adjust symbol values for relocated code 1 03 To crea te user -def ined sy mbols 104 To ente r symbo lic lab el val ues 105 To create an AS CII symbol fi le 106 To cr eate a rea ders. ini file 1 07 Printing/Expor t ing Captured Data 110 Cross-Triggeri ng 112 To cross-trigger with ano ...

  • Agilent Technologies 16760A - page 8

    8 Contents Displaying Capture d Eye Scan Data 133 To open the Eye Scan displ ay 133 To sele ct the channel s disp layed 134 To scale the Eye Scan disp lay 135 To se t Eye Sc an d ispla y option s 136 To make measure ments on the eye scan dat a 142 To d isplay in formatio n about t he eye sc an data 149 To comment on the eye scan data 151 Saving and ...

  • Agilent Technologies 16760A - page 9

    Contents 9 The Eye Scan Tab 204 Labels Subta b 204 Scan Se ttin gs S ubtab 205 Advanced Subtab 206 Qual ifier Subta b 208 Comments Subtab 209 The Calibration T ab 210 Error Messag es 211 Analyze r armed from anot her module contai ns no "Arm in fro m IMB" event 21 2 Branch expr ession is too com plex 212 Cannot speci fy range on labe l wi ...

  • Agilent Technologies 16760A - page 10

    10 Contents Specifications and Characteristics 227 E5378A Singl e-Ended Probe Spe cifications and Characte ristics 228 E5379A D ifferenti al Probe Specificatio ns and Cha racteristics 228 E5380A MICTO R-Compatib le Probe Specificati ons and Characteristi cs 229 1500 Mb/s Samplin g Mode Specifications and Characteristics 230 1250 Mb/s Samplin g Mode ...

  • Agilent Technologies 16760A - page 11

    Contents 11 Glossary Index ...

  • Agilent Technologies 16760A - page 12

    12 Contents ...

  • Agilent Technologies 16760A - page 13

    13 1 Gett ing Starte d After you have connected the logic analyzer probes to your device under test (see “ Step 1. Connect logic analyzer to the device under test” on page 15), all measurements wi ll have the followi ng initial steps: ...

  • Agilent Technologies 16760A - page 14

    14 Chapter 1: Getting St arted • “Step 2. Choos e the samp ling mode” on page 16 • “Step 3. Forma t la bels for th e pro bed s ignal s” o n page 19 In the timing ( asynchronous) or state (synchronous) sam pling modes, measurements wil l have these steps: • “Step 4. Define t he t rigger condi tion” on p age 2 2 • “Step 5. Run t ...

  • Agilent Technologies 16760A - page 15

    15 Chapte r 1: Gettin g Started Probin g and Sampl ing Mode S election Steps Probing and Sampling Mo de Selection Steps Y ou will always take the following steps regar dless of the sampling mode you plan to use. • “Step 1. Connec t log ic ana lyze r to th e de vice under t est” on p age 15 • “Step 2. Choos e the samp ling mode” on page ...

  • Agilent Technologies 16760A - page 16

    16 Chapter 1: Getting St arted Probi ng and Samplin g Mode Selecti on Step s Step 2. Choose the sampl ing mode There are t hree logic analyzer samp ling modes to choose fro m: tim in g mode , state m ode , and eye scan mode . In timing mode , the logic analyzer samples asynchronou sly , based on an internally- generated sampling clock. In state mod ...

  • Agilent Technologies 16760A - page 17

    17 Chapte r 1: Gettin g Started Probin g and Sampl ing Mode S election Steps If you chose T iming Mo de 1. Select the timing anal yzer conventio nal/transitional configuration . In the transiti onal timing configurat ion, the logic analyzer can captu re a gre ater period of executio n because only tran sitions are stored in memory . 2. If you chose ...

  • Agilent Technologies 16760A - page 18

    18 Chapter 1: Getting St arted Probi ng and Samplin g Mode Selecti on Step s 3. Speci fy the sa mpling positio n. Sele ct the Sampling Pos itions... button , then select the Run Eye Finder butto n to locate the data valid window in relat ion to the samp ling c lock, a nd autom atical ly set the sam pling positio n of th e logic anal yzer . See Als ...

  • Agilent Technologies 16760A - page 19

    19 Chapte r 1: Gettin g Started Probin g and Sampl ing Mode S election Steps Step 3. Format labels for the probed si gnals When a logic analy zer probes hundreds of si gnals in a device under test, you need to be able to give t hose channels m o re meaningf ul names t han "pod 1, channel 1" . The Format tab i s mainly used fo r assigning ...

  • Agilent Technologies 16760A - page 20

    20 Chapter 1: Getting St arted Probi ng and Samplin g Mode Selecti on Step s T o assign pods to the logi c analyzer 1. In the F ormat tab, sele ct the Pod Assignment bu tton. 2. In the Pod Assignment dialog, drag a po d to the appropriate lo gic analyzer . 3. Sele ct the Clo se but ton. T o specify threshold voltages The threshold voltage is the vo ...

  • Agilent Technologies 16760A - page 21

    21 Chapte r 1: Gettin g Started Probin g and Sampl ing Mode S election Steps Defined thr eshold vol tage. 7. Sele ct the Clo se but ton. 8. Sele ct the Clo se but ton. T o assign names t o logic ana l yzer ch annels 1. Sele ct a labe l butto n, and ei ther: • Cho o se th e Rename c ommand, enter th e labe l nam e, and select th e OK button. • O ...

  • Agilent Technologies 16760A - page 22

    22 Chapter 1: Getting St arted T imi ng Mo de or St ate Mode S teps T iming Mode or State Mode Steps When you have sele cted the timing or state sampl ing modes, you need to perform the following steps. • “Step 4. Define t he t rigger condi tion” on p age 2 2 • “Step 5. Run the m easur ement” on page 23 • “Step 6. Displa y the captu ...

  • Agilent Technologies 16760A - page 23

    23 Chapte r 1: Gettin g Started T iming Mode or Stat e Mode Steps 2. In the T rigger Seq uence port ion of th e T rigger tab, sel ect the but tons to define the l abel values and/ or other condi tions you want to tri gger on. Next: “Step 5. Run the measurement” on page 23 Step 5. Run the measur ement Once the trigg er condition has been defined ...

  • Agilent Technologies 16760A - page 24

    24 Chapter 1: Getting St arted T imi ng Mo de or St ate Mode S teps Logic analyzers with deep acquisition memory ta ke a noticeable amount of time t o complete a run; howe ver , messages like "W aiting in leve l 1" may indic ate you need to st op the measureme nt and refine t he trigger condit ion . When the tr igg er con ditio n is fo un ...

  • Agilent Technologies 16760A - page 25

    25 Chapte r 1: Gettin g Started T iming Mode or Stat e Mode Steps T o add display to ols via the W orkspace wi ndow 1. Select th e W orkspace button (or from the W i ndow menu, select Syst em and W orkspace). 2. I n the W orkspa ce wi ndow , scro ll down t o the Display p ortion of the too l icon list. 3. Drag th e display tool ic on and d rop it o ...

  • Agilent Technologies 16760A - page 26

    26 Chapter 1: Getting St arted Eye Scan M ode St eps Eye Scan Mode Steps When you have selected the e ye scan sampling mode, yo u need to perform t he follo wing steps. • “Step 4. Selec t channe ls for the eye scan measure ment” on page 26 • “Step 5. Set the eye sc an r ange and r esoluti on” o n page 27 • “Step 6. Run th e eye sca ...

  • Agilent Technologies 16760A - page 27

    27 Chapte r 1: Gettin g Started Eye Scan M ode St eps Next: “Step 5. Set the eye scan rang e and resolution” on pag e 27 Step 5. Set the eye scan range a nd resolution 1. In the Ey e Scan ta b, Scan Settings subtab , select the set tings fo r the eye scan measurement. ...

  • Agilent Technologies 16760A - page 28

    28 Chapter 1: Getting St arted Eye Scan M ode St eps These se ttings de fine the number and size of the time and voltag e windows used in th e eye scan. Meas uremen ts using the coar se settings r u n fa ster because ther e are fewer time and voltage windows to scan, but the resulting eye diagrams have less resolut ion. Measu rement s usin g the fi ...

  • Agilent Technologies 16760A - page 29

    29 Chapte r 1: Gettin g Started Eye Scan M ode St eps Once the eye scan settings have been selected , you can run the measurement. 1. Select th e Run Single button . The Eye Scan display wi ndow opens, and the capture d measureme nt data begi ns to ap pear . While th e eye scan meas ureme nt runs, the Stop button b ecomes avail able. The esti mated ...

  • Agilent Technologies 16760A - page 30

    30 Chapter 1: Getting St arted Eye Scan M ode St eps In the Eye Scan display window , use the following subtab s: • Scale to zoom in or out o n the cap tured data. • Displ ay to c hange the displa y optio ns. • Measurements to use tools for di splayi ng useful informati on about the data. • Info to display textual infor mation about th e ca ...

  • Agilent Technologies 16760A - page 31

    31 Chapte r 1: Gettin g Started For More Informa tion... For More Information... On conn ecting the logic anal yzer: • “Pr obing th e Device Under T est” on pa ge 35 • Set up Assistant (see the Setup As sist ant help vol ume) (when usin g analysis probes). • Logic Analy sis System and Measurement Modules Ins tallation Guide for probe pino ...

  • Agilent Technologies 16760A - page 32

    32 Chapter 1: Getting St arted For More Informa tion... • Using the Cha rt Displa y T oo l (see th e Chart Display T ool help volume ) • Us ing the Distri bution Disp lay T ool (see the Distribution Display T ool help v olume ) • Usin g the Compare Analys is T ool (see the Compa re T ool help volume) ...

  • Agilent Technologies 16760A - page 33

    33 2 Probing and Selecting the Sampli ng Mode • “Prob ing the Dev ice Und er T est” on p age 35 ...

  • Agilent Technologies 16760A - page 34

    34 Chapt er 2: Probing and Sele cting the Sampl ing Mode • “Choosing the Sampl ing Mode” on page 4 3 • “Selectin g the Timing Mode (Async hronous Sam pling)” on pa ge 43 • “Selectin g the State Mod e (Synchron ous Sampli ng)” on page 46 • “In Either Timing Mode or State Mo de” on page 53 • “Se lecting t he Eye Scan Mode? ...

  • Agilent Technologies 16760A - page 35

    35 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Probing t he Device Under T est Probing the Device Under T est When using t he 16760A logi c analyzer , there are four probing options available: • “Using the E5378A Singl e-Ended P robe” on page 35 • “Usi n g t he E5379A Di fferential Probe” on p age 37 • “Usin g the E53 80A ...

  • Agilent Technologies 16760A - page 36

    36 Chapt er 2: Probing and Sele cting the Sampl ing Mode Probing t he Device Under T est Y ou can order mating connector s separately using the Agilent part number: • 1253-3620 (or Samt ec #ASP-65067-01) Y ou can order support shrouds separatel y using the Agilent part numbers: • 16760-0230 2 for PC board thicknesse s up to 0.062 in. • 16760- ...

  • Agilent Technologies 16760A - page 37

    37 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Probing t he Device Under T est If the clock input is a single-ended signal, eith er ground the negative clock input and adjust th e clock threshold voltage in the use r interface, or connect the negative clock inp ut to the DC clock threshold reference volt age. In the user inter face, the ...

  • Agilent Technologies 16760A - page 38

    38 Chapt er 2: Probing and Sele cting the Sampl ing Mode Probing t he Device Under T est Y ou can order mating connector s separately using the Agilent part number: • 1253-3620 (or Samt ec #ASP-65067-01) Y ou can order support shrouds separatel y using the Agilent part numbers: • 16760-0230 2 for PC board thicknesse s up to 0.062 in. • 16760- ...

  • Agilent Technologies 16760A - page 39

    39 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Probing t he Device Under T est Using the E5380A Mictor -Compati ble Probe The E5380A MICTO R-compatible probe has a MICTOR connector end. If you have a device under test with connectors desi gned for the Agilent E534 6A high-density pro be adapter , you can also use the E5380A probe. Howeve ...

  • Agilent Technologies 16760A - page 40

    40 Chapt er 2: Probing and Sele cting the Sampl ing Mode Probing t he Device Under T est The clock input on the E5380A probe is single-ended. The cl ock threshold voltage may be adjusted independently o f the data threshold voltages. See Also “T o set pod thr eshold voltages ” on page 58 “T o set clock th reshold vol tages” on page 59 For c ...

  • Agilent Technologies 16760A - page 41

    41 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Probing t he Device Under T est single-ended signal. If the clock input i s a differential signal, select the "different ial" optio n in the clock threshol d user interface. If the clock input is a single-ended signal, ground the negati ve clock input and adj ust the clo ck thresho ...

  • Agilent Technologies 16760A - page 42

    42 Chapt er 2: Probing and Sele cting the Sampl ing Mode Probing t he Device Under T est analysis syste m helps you to properly configu re the logic analyzer . ...

  • Agilent Technologies 16760A - page 43

    43 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Choos ing the Sa mpling Mo de Choosing the Sampling Mode There are t hree logic analyzer samp ling modes to choose fro m : tim ing mode , state m ode , or eye scan mode . In timing mode , the logic analyzer samples asynchronou sly , based on an internally- generated sampling clock. In state ...

  • Agilent Technologies 16760A - page 44

    44 Chapt er 2: Probing and Sele cting the Sampl ing Mode Choos ing the Sa mplin g Mode T o select the timing mode 1. Open the logic analyze r Setup w indow . 2. Selec t the Samp ling tab . 3. Choose t he T i ming Mo de opti on. Y ou can also select the tim ing sampling mode in the “Pod Assignment Dialog” on pa ge 17 5. T o select the conv entio ...

  • Agilent Technologies 16760A - page 45

    45 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Choos ing the Sa mpling Mo de NOTE: If all pod s are used , memory de pth is reduced b y half in order to st ore the requ ired t ime tags . NOTE: W ith the Sam ple Period at 2. 5 ns, data is acqui red at two time s the trigger sequencer rate. This means that data mus t be present for at leas ...

  • Agilent Technologies 16760A - page 46

    46 Chapt er 2: Probing and Sele cting the Sampl ing Mode Choos ing the Sa mplin g Mode Selecting the State Mode ( Synchronous Sampling) In state mode , the logic analyzer sam ples synchron o usly , based on a sampling cloc k signal from the device under test. T ypically , the signal used for sam pling in state mode is a state machin e or micropro c ...

  • Agilent Technologies 16760A - page 47

    47 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Choos ing the Sa mpling Mo de T o select th e state mod e 1. Open the logic analyzer Setu p window . 2. Selec t the Samp ling tab . 3. Choose t he State Mode o ption. Y ou can also select the state sampling mode in the “Pod Assignment Dialog” on pa ge 17 5. T o select the state speed con ...

  • Agilent Technologies 16760A - page 48

    48 Chapt er 2: Probing and Sele cting the Sampl ing Mode Choos ing the Sa mplin g Mode • 800 Mb/s / 64M State In t h is configura tion: Th e input clo ck signal can be p eriodic or aperio dic, and eith er risin g, falling, or both edges can indicat e valid data. The lo gic analyz er setup/hol d window is 1 ns, and sampling posi tions may b e adju ...

  • Agilent Technologies 16760A - page 49

    49 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Choos ing the Sa mpling Mo de 3. Specify wh en to s ample. Y our choices are Rising Edge , Fa lling Edge , or Both Edges . Only Both Edges is available in the 1250 and 1500 Mb/s configur ations. See Also “T o sele ct the state sp eed config uration” on page 47 T o automatica lly adjust s ...

  • Agilent Technologies 16760A - page 50

    50 Chapt er 2: Probing and Sele cting the Sampl ing Mode Choos ing the Sa mplin g Mode 6. In the Sampli ng Posit ions dia log, selec t the Eye Finder opt ion. 7. In the Ey e Finder Se tup tab, se lect the Use si gnals fro m Device Unde r Te s t option. The Use demo data (no probes req uired) o ption is fo r dem onstrat ion purposes onl y . 8. Cho o ...

  • Agilent Technologies 16760A - page 51

    51 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Choos ing the Sa mpling Mo de In the Eye Finder Results tab, you can see how the stable and transitioning areas vary over time. 3. Sele ct the Stop Eye Finder button. To v i e w eye finder data as a bus comp o site When you want a compressed, high-le vel view of the eye finder data: 1. In th ...

  • Agilent Technologies 16760A - page 52

    52 Chapt er 2: Probing and Sele cting the Sampl ing Mode Choos ing the Sa mplin g Mode eye finder data must be saved a nd loaded se parately . 1. In the File Info tab, selec t the Save As... or Load... butto ns. Y ou can also choose the Save Eye Finder or Load Eye Finder command from th e Fil e me nu. 2. In the fi le brow ser dialo g, nam e the fil ...

  • Agilent Technologies 16760A - page 53

    53 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Choos ing the Sa mpling Mo de See Also “Underst anding Stat e Mode Sampl ing Posit ions” on page 2 56 “T o a utoma tical ly adj ust s ampling pos ition s” on page 4 9 In Either T iming Mode or State Mode • “T o spe cify the trigge r positio n” on pag e 53 • “T o s et acq ui ...

  • Agilent Technologies 16760A - page 54

    54 Chapt er 2: Probing and Sele cting the Sampl ing Mode Choos ing the Sa mplin g Mode 1. In the Sa mplin g tab (or in the Sett ings su btab of the T r igger tab), select the a cquisi tion de pth. The number of sa mple s that can b e ch osen fo r the Acqu isit ion De pth ar e approximations. The co mbination of count tags, pod assignme nts, and con ...

  • Agilent Technologies 16760A - page 55

    55 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Choos ing the Sa mpling Mo de turn it on agai n by s ele cting the Setup butto n in the Sy stem wind ow or by dragging the analyze r's instrument tool icon to the workspace in the W orkspace window . Selecting the Eye Scan Mode In eye scan mode , the logic analy zer becomes a tool for v ...

  • Agilent Technologies 16760A - page 56

    56 Chapt er 2: Probing and Sele cting the Sampl ing Mode Choos ing the Sa mplin g Mode configurati on, the input r eference clock e dges can occur at rates up to 800 MHz. Y ou can choose from: • 800 Mb/s / Eye Scan In t h is configura tion: Eith er rising, falling, or both e dges of t h e i n put reference clock can indicate valid data. All of th ...

  • Agilent Technologies 16760A - page 57

    57 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Formatt ing Labels for Logic Analyzer Probes Formatting Labels for Logic Analyz er Probes The Format tab i s m ainly fo r assigning b us and si gnal names (from the device under test) , to logic analy zer channels. These names are called labels. Labels ar e used when setting up triggers and ...

  • Agilent Technologies 16760A - page 58

    58 Chapt er 2: Probing and Sele cting the Sampl ing Mode Formatt ing Labels for Logic Analyzer Probes Capt uring D ata on 17 Channe ls in St ate Mode On a single-card 1 6760A logi c analyzer in the state (synchronous) sampling mode, you can assign pod 2 to the logic analyzer and unassign pod 1. (On e pod must be unassigned in o r der to stor e time ...

  • Agilent Technologies 16760A - page 59

    59 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Formatt ing Labels for Logic Analyzer Probes appropriate thresho ld voltage r eference leve l. • Sel ect the Diffe rentia l opti on. This option ap pears when the E 5379A differ ential pr obe is use d . It should b e selec ted when di ffer ential signal s are probed. T he differenc e volta ...

  • Agilent Technologies 16760A - page 60

    60 Chapt er 2: Probing and Sele cting the Sampl ing Mode Formatt ing Labels for Logic Analyzer Probes 2. In the Clock Thres holds dialog, select th e button of the clock whose threshold vol tage you wish to set. 3. In the J, K , etc., thr eshold di alog, ei ther: • Sel ect the Standar d optio n; th en, sele ct on e of the prede fine d threshold v ...

  • Agilent Technologies 16760A - page 61

    61 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Formatt ing Labels for Logic Analyzer Probes • Or , ch oos e the Insert b efore or Inse rt a fter command, ent er the la bel name, and select the OK butto n. 2. In the lab el row , selec t the butto n of the pod th at contai ns the ch annels you want to assign . 3. Either ch oose one of th ...

  • Agilent Technologies 16760A - page 62

    62 Chapt er 2: Probing and Sele cting the Sampl ing Mode Formatt ing Labels for Logic Analyzer Probes “T o ch ange the la bel pol arity” on page 64 T o import l abel names and assignments from a netlist Y ou can create label names and assign logic analyzer probe channels by importing n etlists. These netlists co me from the Electronic D esign A ...

  • Agilent Technologies 16760A - page 63

    63 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Formatt ing Labels for Logic Analyzer Probes “T o assig n probe channels to labe ls” on page 60 “T o impo rt labe l definit ions fr om an ASCII fi le” on page 63 T o import label def initions from an ASCII file Y ou can create label names and assign logic analyzer probe channels by i ...

  • Agilent Technologies 16760A - page 64

    64 Chapt er 2: Probing and Sele cting the Sampl ing Mode Formatt ing Labels for Logic Analyzer Probes T o assign label name "O range" to channel s 15 through 5 on pod A3, channel 5 on pod A2, and channel 6 on pod A1: Orange;A3[15:5];A2[5];A1[6] T o ass ign l abe l nam e "Re d" to th e K cl ock of the lo gic analy zer in slot A: ...

  • Agilent Technologies 16760A - page 65

    65 Chapt er 2: Probin g and Sel ecting the Samplin g Mode Formatt ing Labels for Logic Analyzer Probes Positive polarity means that a high voltage is a logic "1". Negative polarity means that a high voltage is a l ogic "0". Changing the label polarity will have the fo llowing effects: • "1" and "0" valu es ...

  • Agilent Technologies 16760A - page 66

    66 Chapt er 2: Probing and Sele cting the Sampl ing Mode Formatt ing Labels for Logic Analyzer Probes NOTE: Lab els with reor dered bi ts cannot be used as range te rms or <, <=,>, >= in trigge rs. T o turn labels off or on When you temporarily want to remove a label and its data, yo u can turn off the label. The label name and its bit ...

  • Agilent Technologies 16760A - page 67

    67 3 Using the Logic Analyze r in T imi ng or State Mode • “Settin g Up T riggers and Running Measur ements” on pag e 69 ...

  • Agilent Technologies 16760A - page 68

    68 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode • “Usin g T rigg er Funct ions” on page 70 • “Usin g Ot her Trigger Fe ature s” on pa ge 75 • “Edi ting th e T rigg er Se quen ce (T i min g or 200 , 400 Mb/s Sta te On ly)” on page 78 • “Edi ting Ad vanced Trigger Funct ions ( T im ing or 200 Mb/s State On ly)? ...

  • Agilent Technologies 16760A - page 69

    69 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements Setting Up T riggers and Running Measurements This section describes setting up triggers for the tim ing and state sampling mo des and for all configur a tions wi t hin these modes. Some triggering functionality is only avail able in ...

  • Agilent Technologies 16760A - page 70

    70 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts State and transitional timing analysi s trigger definitions are made simpler with a defa ult sto rage qual ifier . This make s it possible to ignore, at al l trigger sequence le v els, the question about what to do with the captured d ...

  • Agilent Technologies 16760A - page 71

    71 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements trigge r functi on. A pictu re des cribing t he tri gger funct ion is shown. 2. Sele ct the Replace button (or Insert before or In sert aft er butto n) to move it to t he T rigge r Sequenc e below . 3. In the T rig ger Seq uence , sel ...

  • Agilent Technologies 16760A - page 72

    72 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts “T o ent er symbol ic label values” on page 105 “Symbol s Selector Dialog” on page 195 T o sp ecify a label edge event Label edge e v ents let you specify edges and gl itches on a bus. Label edge event s are only available in ...

  • Agilent Technologies 16760A - page 73

    73 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements taken place). If y ou only wa nt to loo k the advan ced trig ger functi on, without ed iting it, you can expand the trigger function . 3. Select OK in the con firmatio n dialo g. T o expand a trigger func tion 1. In the T rigger tab, ...

  • Agilent Technologies 16760A - page 74

    74 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts description, and select the level s from the current tr igger sequence t hat be the trig ger functi on; then, s elect OK. Once you have created a tri gger function library with trigge r functions, you can: • Load or unload t he trig ...

  • Agilent Technologies 16760A - page 75

    75 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements page 72 “Savin g/Recalling Trigger Setu ps” o n page 90 Using Other T ri gger Features Other subtabs i n the T r igger t ab let yo u do things like: specify ing whether a state or ti me count is stored with samples, or setting up ...

  • Agilent Technologies 16760A - page 76

    76 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts pod to be le ft unassign ed. See Also “T o sele ct the state sp eed config uration” on page 47 “T o assign pod s to the analyzer ” on page 57 T o specify default storing Y ou can set up default storing so that o nly the data s ...

  • Agilent Technologies 16760A - page 77

    77 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements the contex t of the measur ement): a. Select the Select Labels button . b. In the T ransitional L abel Select dialog, hi ghlig ht the desi red labe l from th e Av ailable Labels list; the n, sele ct the ri ght-arro w but ton to move t ...

  • Agilent Technologies 16760A - page 78

    78 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts “T o s elect the conventi onal/trans itio nal config uration” on pa ge 44 T o specify wh ether defau lt storing is initiall y on or off In the state sampling mo de, or in the timing sampling mode' s 400 MHz / 32M S ample T ra ...

  • Agilent Technologies 16760A - page 79

    79 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements • “T o clear the tr igger sequence” o n page 83 See Also “Seque nce Leve ls” on page 242 in “Und erstandi ng Logi c Analyze r T riggering” on page 24 0 T o i nsert/replace/del ete seq uence levels T o i nsert sequ ence l ...

  • Agilent Technologies 16760A - page 80

    80 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts See Also “T o cut/cop y-and-paste sequence levels” on p age 80 T o cut/copy-an d-paste seq uence levels Y ou can change the order of levels in the trigger sequence by cuttin g- and-pasting or you can copy levels by copy ing-and-pa ...

  • Agilent Technologies 16760A - page 81

    81 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements evaluation of t he sample. Y ou can set up multi-way branches using advanced trigger functions or by selecting an If button and choosing Insert BRANC H . NOTE: Whe n you want to te st a single samp le for multip le conditi ons and t a ...

  • Agilent Technologies 16760A - page 82

    82 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts Note that the e-mail is sent when the trigger occurs and not after the logic analyz er's acquisition memo ry is full. Y ou only need to specify one send e-mail action per trigger sequence. As long as o ne trigger act ion sends e- ...

  • Agilent Technologies 16760A - page 83

    83 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements • HTTP , F TP , SMTP and other pr otocols , each with defin ed sets of rule s to use w ith othe r Intern et points relativ e to a de fined s et of capabilit ies. T o view a pic ture of th e trigge r sequenc e 1. In the T r igger ta ...

  • Agilent Technologies 16760A - page 84

    84 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts (label events), and the action is to trigger the logic analy z er . However , events can also test timer , counter , and/or flag values that are set up in the logic analy zer , and actions can include setting up timers, counters, and ...

  • Agilent Technologies 16760A - page 85

    85 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements 2. Enter an occurre nce count value. 3. If the occ urrenc e count is greate r than 1, se lect whe ther the e vent sho uld occur consecutively or eventually . The event must occur the specified nu mber of times be fore the a ction is t ...

  • Agilent Technologies 16760A - page 86

    86 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts T o i nsert a time r event T ime r eve nts a re li ke othe r events in that they evaluate to either tr ue or fa lse. 1. In the T rigg er tab 's T r igger Seque nce ar ea, s elec t one o f th e exi sting event butt ons (fo r examp ...

  • Agilent Technologies 16760A - page 87

    87 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements 4. Enter the c ounter val ue. T o insert f lag actions/events Flags can be used to signal between modules in the logic analy sis system main frame, an expansio n frame, or in multiple frame s connected wi th the mult iframe module. Th ...

  • Agilent Technologies 16760A - page 88

    88 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts inse rt a Pulse set action for a fl ag in one analyzer , you cannot i nsert a Pulse clear action for the same flag in a different analyzer . NOTE: W ithi n an an alyz er , t he same flag cann ot be u sed i n bot h Puls e and L eve l ( ...

  • Agilent Technologies 16760A - page 89

    89 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements When driving the Port Out signal with a flag, you can sel ect the Feedthrough t ype to pas s the cur rent sta te of the fl ag (set or clear) direc tly t o Port Ou t. 3. For the Armed by opti on, select the flag that will drive the Por ...

  • Agilent Technologies 16760A - page 90

    90 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts T o give an event list a name 1. In the T ri gger ta b's T rig ger Seq uence ar ea, sele ct the If , If not , Else if , or Else i f not but ton, and c hoose Na me ev ent li st . 2. In the Nam e Eve nt List dia log, ent er the nam ...

  • Agilent Technologies 16760A - page 91

    91 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements 3. Sel ect a memo ry locatio n to stor e the trig ger setup in. 4. In the B uffer Na me dialo g, enter a descrip tive name for the tri gger se tup. T o recall a t rigger setup 1. In the Trigger tab's Save/R ecal l subt ab, sele c ...

  • Agilent Technologies 16760A - page 92

    92 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Setti ng Up T rigge rs and Runn ing Measuremen ts Group Run Repet itive, or Run Al l button. Run starts on ly the i nstrument you are using. Sin gle run s gather d ata until t he l ogic analy zer m emory is full, and th en s top. Repet itive r uns k eep r epea ting th e sam e me asur ...

  • Agilent Technologies 16760A - page 93

    93 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Settin g Up T riggers an d Running M easurements “Error Me ssages ” on page 211 T o vi ew the trigge r status While a logic analyze r measurement is running, you can vie w the trigger st at us to see t he sequence level that is eval uat ing captur e d data, occurrence and global ...

  • Agilent Technologies 16760A - page 94

    94 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Displayi ng Captured Dat a Displaying Captured Data Once you have run a m easurement and fill ed the logic analyzer's acquisition memory with captured data, you can display the captur ed data with one of the displ ay tools. Y ou can use analysis tools to filter data and compare ...

  • Agilent Technologies 16760A - page 95

    95 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Displaying Capture d Data W aveform and Listing (and o ther) display tools provide global marke r s that can be used to correlate data that is captur ed by different instrumen t modules o r displayed differently i n other display tool windows. The W aveform and Li st ing display t o ...

  • Agilent Technologies 16760A - page 96

    96 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Displayi ng Captured Dat a 3. Drag th e display tool ic on and d rop it on the analyzer ic on. 4. T o open the disp lay tool, s elect its icon and choose t he Display command. Y ou can use the Chart display tool to chart the data on a l abel over time. For example , if you use storag ...

  • Agilent Technologies 16760A - page 97

    97 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Displaying Capture d Data Y ou can use the Serial Analysis toolset to convert streams of serial data into parallel words which are easier to view and analyze . Y ou can use the System Performance Analysi s toolset to do things like: isolate the ro ot cause of perf ormance bottleneck ...

  • Agilent Technologies 16760A - page 98

    98 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Displayi ng Captured Dat a the actual writ e to this variable. Although the instruction is prefetched, the analyze r can be set to only t rigger when t he wri t e is e xecuted. Capacitive Lo ading on the Device Under T est Excessive capacitive loading can degr ade signals, resulting ...

  • Agilent Technologies 16760A - page 99

    99 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Displaying Capture d Data 3. In the filte r terms , assure the de fault patter n of all "Don't C ares" (Xs) . This configurat ion will always transfer all data from acquisition memory . While t his configurat ion will increase the time of each run, it will guarantee t ...

  • Agilent Technologies 16760A - page 100

    100 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Displayi ng Captured Dat a T o cancel the displa y processing of captured data Y ou can cancel the processing o f captured data if it i s taking too long. 1. Select th e Cancel bu tton. ...

  • Agilent Technologies 16760A - page 101

    101 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Using Symbol s Using Symbols Y ou can use symbol names in place of data values when: • Setting up triggers • Displaying cap tured da ta • Sea rchi ng for p atter ns in Listing di splays • Setting up pattern fil ters • Set ting u p ran ges in the System Perf ormance Ana ly ...

  • Agilent Technologies 16760A - page 102

    102 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Using Symbol s T o load object fil e symbols Object fi les are created by your compile r/linker or ot her software development too ls. 1. Ge nerate an ob ject fi le with symbolic inform ation usin g your softwar e deve lopment to ols. 2. If your language tools can not genera te obje ...

  • Agilent Technologies 16760A - page 103

    103 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Using Symbol s the object f ile symbols are re loaded. T o delete objec t file symbol files 1. Sele ct the Symbol tab , and then the Object File tab. 2. Sele ct the fi le name yo u want to delete in the tex t box l abeled , Object Files with Symbols Loaded For Label . 3. Select Unl ...

  • Agilent Technologies 16760A - page 104

    104 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Using Symbol s whose symbols you wish to relo cate. 3. Sele ct the Relocate Sections... bu tton. 4. Enter the d esired o ffset in the Offset all sectio ns by field. The offs et is applie d from the li nked address or segme n t. 5. Select App ly Offset . 6. Select Cl ose . T o create ...

  • Agilent Technologies 16760A - page 105

    105 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Using Symbol s T o delete user -defined symbol s 1. Under th e Symbol tab, se lect the User Defined tab . 2. Sele ct the lab el you w ant to del ete sym bols from . 3. Sel ect the s ymbol to dele te. 4. Sele ct the Del ete button. 5. Repeat ste ps 3 and 4 to de lete oth er symb ols ...

  • Agilent Technologies 16760A - page 106

    106 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Using Symbol s Pattern . • Use the Fi nd Symbols of T ype sel ectio ns to filter the symbol s by type. 4. Select the sy mbol you want to use from the list of Matching Symbols . 5. If you are using object fi le symbols, you may n eed to: •S e t Offset By (see page 196) to compe n ...

  • Agilent Technologies 16760A - page 107

    107 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Using Symbol s T o create a r eaders.ini fi le Y ou can change how an ELF/Stabs, T icoff or Coff/Stabs symbol file is processed by cr eating a reader .ini file. 1. Crea te the read er .in i file on yo ur w orkstat ion o r PC . 2. Cop y the fi le to /logic/symb ols/reader s.ini on t ...

  • Agilent Technologies 16760A - page 108

    108 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Using Symbol s section will be read com pletely . This can occur i f the file was created without a "gener at e debugger informatio n" flag (usually -g). Using the - g will creat e a Dwarf or Stabs debug section in addition to the ELF section. StabsT ype StabsType=0 Reader ...

  • Agilent Technologies 16760A - page 109

    109 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Using Symbol s C MaxSymbolWidth=60 StabsType=2 Example for Coff/S tabs (using T icoff read er) [ReadersTicoff] C C MaxSymbolWidth=60 StabsType=2 Example for T icoff [ReadersTicoff] C C MaxSymbolWidth=60 ReadOnlyTicoffPage=4 AppendTicoffPage=1 ...

  • Agilent Technologies 16760A - page 110

    110 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Printing/Ex porting Captured Data Printing/Exporting Captured Data T o print captured dat a Y ou can print captured data from displ ay tool windows. 1. In the display tool window , sel ect Print this wind ow from t he Fi le me nu. T o export capture d data Y ou can use the File Out ...

  • Agilent Technologies 16760A - page 111

    111 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Print ing/E xpor ting Ca ptured Data 5. Select th e file name and automati c file sequenci ng options . 6. Sele ct the Read File butto n. 7. Drag disp lay , anal ysis, o r toolset icons an d drop t hem on th e File In tool icon t o view th e imported d ata. See Also Printing W ind ...

  • Agilent Technologies 16760A - page 112

    112 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Cross-T riggering Cross-T riggering An instrument must be armed before it can l ook for a trigger . By default, instrume nts are set to be armed im mediately when you Run the measuremen t . However , you can set an analyzer i nst rument to be arm ed by another instrumen t (in a diff ...

  • Agilent Technologies 16760A - page 113

    113 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Cross-T riggering 2. Choose t he Arm in from IMB menu it em. When t he logic anal yzer drives t he arm signal 1. Set up the logi c analyzer tri gger as you woul d normally . In t he T rigger t ab's T rigger S equence are a, the trig ger action s will sh ow arm out to indicate ...

  • Agilent Technologies 16760A - page 114

    114 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Solving Logic Analy sis Proble ms Solving Logic Analysis Problems • “T o test the lo gic analyzer har dware” on page 1 14 See Also • “I f no thin g happens wh en you st art a meas urement” o n page 92 • “If the cap tured dat a doesn' t look correct” on page 97 ...

  • Agilent Technologies 16760A - page 115

    115 Chapt er 3: Using the Logi c Analyzer in T iming or Stat e Mode Solvin g Logic Anal y sis Problems If any test f ails, contact your local Agilent T echnologies Sales O ffice or Service Center for assistance. See Also Self T est (see the Agilent T echnolo gies 16700A/B-Series Logic Analysis System help vo lume) Agilent T ec hnologies 16760 A 150 ...

  • Agilent Technologies 16760A - page 116

    116 Chapter 3: Usi ng the Logic Analyzer in T iming or Stat e Mode Saving a nd Loading Log ic Analyzer C onfigurations Saving and Loading Logic Analyzer Configurations The Agilent T echnologies 16760A logic analy z er settings a nd data can be saved to a conf iguration file. The configur ation file will include references to any custom trigger libr ...

  • Agilent Technologies 16760A - page 117

    117 4 Using the Logic Analyzer in Eye Scan Mode • “Se tting U p and R unnin g Eye Sca n Measur ements” on pag e 119 ...

  • Agilent Technologies 16760A - page 118

    118 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode • “Disp laying Captu red E ye Sc an D ata” o n pa ge 133 • “Saving and Loading Ca ptured Eye Scan Data” on page 152 ...

  • Agilent Technologies 16760A - page 119

    119 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Settin g Up and R unning Eye S can Measure ments Setting Up and Running Eye Scan Measurements The Eye Scan tab le t s you set up and run Eye Scan measureme nts. Eye Scan measurements sample small windows of time and volt age on logic analyzer data channels. The time windows are relati ...

  • Agilent Technologies 16760A - page 120

    120 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Setti ng Up and Runnin g Eye Scan Me asurements when certain bus sign als transition in one of the device under test's operating modes an d o ther bus si gnals transition in a different operatin g mode. 1. In the Eye Scan tab, selec t the Labels sub tab. 2. Sele ct the b us/signa l lab ...

  • Agilent Technologies 16760A - page 121

    121 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Settin g Up and R unning Eye S can Measure ments T o quickly se t up another meas urement us ing the scale (see page 136) T o run an eye scan measureme nt 1. Aft er selectin g the scan ranges an d resolutio n (see “T o set the eye scan range and re solution” on pag e 120), select ...

  • Agilent Technologies 16760A - page 122

    122 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Setti ng Up and Runnin g Eye Scan Me asurements 1. In the Eye Scan tab, selec t the Ad vanced subtab. Select Quick Scan for a rela tively fast Eye Scan . Select Complete Scan if you ar e concerne d about captu ring n oise and signal anomoli es that lie o utside the ar ea of the most regular ...

  • Agilent Technologies 16760A - page 123

    123 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Settin g Up and R unning Eye S can Measure ments memory device versus a memory control ler . Requir emen ts Qualified e ye scans are performed with double edge clocks. Qualified e ye scans are available only in the 800 Mb/s mode of the 16760 l ogic analyz er . When the qualifier is in ...

  • Agilent Technologies 16760A - page 124

    124 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Setti ng Up and Runnin g Eye Scan Me asurements A suitable qualification sign a l is rare ly available. Instead, an extra circuit (added to the SUT , in a pro be adapter , or other convenient location ) is usually required to decode read/write commands and generate the qualif ier . The anal ...

  • Agilent Technologies 16760A - page 125

    125 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Settin g Up and R unning Eye S can Measure ments The qualifier is ch anged on the second clock cycle of the burst. It remains st able until after the next clock cycle following t he end of the burst. If the clock pauses between burst s (as shown above), then the qualifier le v el for ...

  • Agilent Technologies 16760A - page 126

    126 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Setti ng Up and Runnin g Eye Scan Me asurements 3. If you have only one 16760 l ogic analyzer card, on the T rigger tab, se lect the Setti ngs subtab, and set Count to Off . This makes the second pod available for use by the qualifier . If yo u have a multi-card module (more than one 16760 ...

  • Agilent Technologies 16760A - page 127

    127 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Settin g Up and R unning Eye S can Measure ments 4. A ssign pod A2 to th e analyzer: • In the analyzer's Fo rmat tab sele ct the Pod Assignment button . •D r a g t h e A2 pod from the Unassigned P ods sect ion to the Analyzer section. • Sel ect Clos e . 5. Define a lab el f ...

  • Agilent Technologies 16760A - page 128

    128 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Setti ng Up and Runnin g Eye Scan Me asurements 6. Select S ampling Positions ... to open the Samplin g Position s dialog. Select the label yo u create d and choose Expand to display al l the sign als (if it is not already expande d). 7. Start your tar get system and sele ct Run Eye Finder ...

  • Agilent Technologies 16760A - page 129

    129 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Settin g Up and R unning Eye S can Measure ments Now , set up eye scan mod e 1. Sele ct the Eye Scan bu tton o n the Sampling tab. Ensure that eye scan is set to 800 M b/s / Eye Sca n and the Master cl ock is set to Both Edges . ...

  • Agilent Technologies 16760A - page 130

    130 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Setti ng Up and Runnin g Eye Scan Me asurements 2. Sele ct the Eye Scan tab. 3. Sele ct the Qualifier subt ab. ...

  • Agilent Technologies 16760A - page 131

    131 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Settin g Up and R unning Eye S can Measure ments 4. Sele ct the Qualify ey e scan sampling us ing... button. 5. Use t he Q ualificat ion Level buttons to select whether eye scan dat a is coll ected w hen the qua lifie r signal i s high or low . Note that t he names "high" an ...

  • Agilent Technologies 16760A - page 132

    132 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Setti ng Up and Runnin g Eye Scan Me asurements Make e ye scan meas urements The logic analyz er is now ready to make qualified eye scan measurements. Select the r un icon to run t he eye scan. All other ey e scan settings are available and are the same as they are i n non-qualifie d measur ...

  • Agilent Technologies 16760A - page 133

    133 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data Displaying Capture d Eye Scan Data Once you have run an eye scan measurement, captured measuremen t data is displ ayed as eye diagrams in the Eye Scan display . The Eye Scan di splay has the following measurement tools: sl ope, limits, 4 point, 6 poi ...

  • Agilent Technologies 16760A - page 134

    134 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data NOTE: There is no Eye Scan disp lay too l icon in th e W ork space w indow b ecause the Eye Scan dis play does n't work with th e standar d form of capture d logic analy zer data (like, for example, the W aveform a nd Listin g display tools do ). Inst ...

  • Agilent Technologies 16760A - page 135

    135 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data T o scale t he Eye Scan display The Eye S c an display' s scaling options on the Scale tab let you change the display scale of the captured eye scan data. Also, you can click -and- drag to zo om in on a portion o f the Eye Scan display . T o use ...

  • Agilent Technologies 16760A - page 136

    136 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data T o zoom-in on the disp l ayed dat a using t he click-and-dr ag method T o zoom in on a sele cted portion of t he Eye Scan display , select the upper left corner of the area you want to enlarge, drag down and to the righ t, then relea se the s election too ...

  • Agilent Technologies 16760A - page 137

    137 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data In the Dis pla y tab , you c an: • Cha nge the Display Mode . The Gray Sca le opt ion sho ws the me asure ment da ta in gray -scal e wher e the br ight ness of a re gion indica tes th e nu mber of tr ansiti ons d etected in that regi on. The Color ...

  • Agilent Technologies 16760A - page 138

    138 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data The Solid Colo r option shows measurem ent data as a solid color in all regions whe re transitions were detected. The Ch Den sity Gr ay option sh ows the measur emen t data in sh ades of gray where the bright ness of a region indicat es the nu mber o f log ...

  • Agilent Technologies 16760A - page 139

    139 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data The Ch Densi ty Colo r opt ion s hows th e mea surem ent da ta i n colo r wher e the colo r of a regi on indicate s the number of logic anal yzer channe ls which have transitio ned in that region. 2. Cha nge the Display Mode se ttings. See “T o cha ...

  • Agilent Technologies 16760A - page 140

    140 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data See Also “T o open th e Eye Scan display” on pa ge 133 “T o s cale the Eye Sca n d ispla y” on page 135 “T o change th e Eye Scan color scale” on page 140 “T o select the c han nels disp layed” on p age 134 T o change the Eye Sca n color sc ...

  • Agilent Technologies 16760A - page 141

    141 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data 3. Sele ct the Linear button to equally d ivide the color scale so that each color re pres ents an e qual in cremen t of tran sitions . Selec t the Log , Log2, or Log10 scale but tons to se parate t he di splay of transitions d etected using a logari ...

  • Agilent Technologies 16760A - page 142

    142 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data box associated with the white color bar t o bring out detail i n the eye diagram. The Default Limits button can be used to return the bl ac k and white limit v alues to settings that sho uld produce a typical eye d iagram. The Default button at the botto m ...

  • Agilent Technologies 16760A - page 143

    143 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data •T u r n o n t h e 4 Pt Box tool . This tool is a b ox t hat di splay s time (box width), vo ltage (box height), and numbe r of trans itions d etected. Each point o f the box can be repos itioned. ...

  • Agilent Technologies 16760A - page 144

    144 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data •T u r n o n t h e 6 Pt Box t ool. Th is tool is als o for me asuri ng time , volta ge, and the nu mber of transiti ons detect ed within th e area. The 6 Pt Box has 6 poi nts that can be re position ed to mat ch the shape of an eye . Because of the box&a ...

  • Agilent Technologies 16760A - page 145

    145 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data •T u r n o n t h e Diamond tool. This too l is also f or measur ing ti me, voltage, and number of hi ts. Numbe r of hits refers to the number of transiti ons det ected wi thin th e area . The Diamond tool has 4 points that c a n be repo sitioned to ...

  • Agilent Technologies 16760A - page 146

    146 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data •T u r n o n t h e Sl ope T ool tool. Th is tool i s for me a su ring t he slope of rising and falling edges in an eye. It also shows the change in time and volta ge betwee n two poin ts. The slo pe tool i s a line with two e ndpoints that can be reposit ...

  • Agilent Technologies 16760A - page 147

    147 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data •T u r n o n t h e Histogr am too l. Th is t ool d isplay s a histo gram of t he relative number of tran sitions at a particular voltage betwe en two times . The hist ogram tool is a hori zon tal line in the disp lay wit h two endpo ints th at can ...

  • Agilent Technologies 16760A - page 148

    148 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data •T u r n o n t h e Cursor1 or Cursor2 tools. Cur sors are sin gle poin ts that disp lay the time and voltage wher e they are pos itioned. (T o display t he chan ge in time an d volta ge between two po ints, use the Slope tool instead of tw o cursors.) Cu ...

  • Agilent Technologies 16760A - page 149

    149 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data Any combination of t he measurement tools can be used at t he same time. Infor m ation fo r all select ed tools is disp layed. Y ou can use the scroll bars to navigate through the i nformation. See Also “T o open th e Eye Scan display” o n page 1 ...

  • Agilent Technologies 16760A - page 150

    150 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Displayi ng Captured Eye Scan Data In the Info tab, you can: • View information about which logic analyzer the Eye Scan d ata is from, how many channels are dis played, and when the data was acquired. • Sel ect the Show Info fo r All C h annels button to d ispla y deta iled infor matio ...

  • Agilent Technologies 16760A - page 151

    151 Cha pter 4 : Usin g the Log ic Ana lyz er in Eye Sc an Mo de Displayi ng Captured Eye Scan Data point (see “T o set advanced eye scan options” on page 121), th e number of scan points that wer e measured, and the amount of system memory required fo r the data. When you save a co nfiguration that includ es data, Mem size also shows the amo u ...

  • Agilent Technologies 16760A - page 152

    152 Chapter 4: Usi ng the Logic Analyzer in Eye Scan M ode Saving a nd Loading C aptured Ey e Scan Data Saving and Loading Captured Eye Scan Data When the logic analyzer configuration is saved with data , captur ed eye scan data is in c luded. Eye sc an data can be restored by loading a logic analyzer con figuration file. For mo re information, see ...

  • Agilent Technologies 16760A - page 153

    153 5 Reference • “The Sa mpling T ab” on page 155 • “The Format T a b” on page 174 • “The T rigger T ab ” on page 176 ...

  • Agilent Technologies 16760A - page 154

    154 Chapter 5: Refer ence • “The S ymbols T ab” on pa ge 193 • “Error Me ssages” on page 211 • “Specifications and Characteristics” on pag e 227 ...

  • Agilent Technologies 16760A - page 155

    155 Chapter 5: Re ference The Sa mpling T ab The Sampling T ab The Sampling tab lets you choose bet ween the lo gic analyzer's: • Asynchr onous sampli ng T im ing Mode • Synchrono us samp ling State Mode • T ime and voltage scann ing (relative to a clock from the device under test) Eye Scan Mode. This tab also lets you set cont rols for ...

  • Agilent Technologies 16760A - page 156

    156 Chapter 5: Refer ence The Sa mpling T ab T iming Mode When you select T iming Mode, the T iming Mode Controls area appears. Convent ional/ Tr a n s i t i o n a l Configura tion Lets you c onfigure th e timing an alyzer to us e memory fo r all s amples (conv entional) o r just samp les that a re differe nt than previ ously store d sample (tr ans ...

  • Agilent Technologies 16760A - page 157

    157 Chapter 5: Re ference The Sa mpling T ab “In Either Timing Mode or State Mode” on page 53 How Samples are Store d in T ransitional T imi ng In the timing mode's 400 MHz / 32M Sample T ransitional or Store Qualified configuration, with the exception of t he first sample, the logic analyz er must store two samples (four when sampling at ...

  • Agilent Technologies 16760A - page 158

    158 Chapter 5: Refer ence The Sa mpling T ab State Mode When you select State Mo de, the State Mode Controls area appears. State Sp eed Configura tion Lets you con figur e the state ana lyzer for fas ter samplin g, but with half of the ch annels. T rigger Posit ion Lets y ou specify where the sample that triggered the analyzer should app ear among ...

  • Agilent Technologies 16760A - page 159

    159 Chapter 5: Re ference The Sa mpling T ab as the sam pli ng clock. Generally , the state mode sam pling clock is taken from the signals that clock valid dat a in the device under test. See Also “Select ing the State Mod e (Synchron ous Sampli ng)” on page 46 “In Either Timing Mode or State Mode” on page 53 Sampling Positions Dial og The ...

  • Agilent Technologies 16760A - page 160

    160 Chapter 5: Refer ence The Sa mpling T ab Sampling Positions T ab The Sampling Positions display is a digital "eye" diagr am in that it represent s many samples of data capture d in relation to the sam pling clock. The tr ansitioning edges me asured before and after the sampling clock result in a picture that is eye-shaped. Y ou should ...

  • Agilent Technologies 16760A - page 161

    161 Chapter 5: Re ference The Sa mpling T ab view , set the sampl ing po sitio ns to the s uggested s ampling positio ns, and remove all eye finder data. Label bu ttons Let you e xpand/c olla pse the si gnals in a labe l, set the bus view , choose the suggest ed sampling position, and show message or time s tamp informati on. Display Area Shows: ? ...

  • Agilent Technologies 16760A - page 162

    162 Chapter 5: Refer ence The Sa mpling T ab How th e Selected Posi tion Behaves 1. When eye finder is enabled, t he select ed positi on (blue li ne) is set based on t h e man ual setu p/hold val ue. 2. When ever the select ed posi tion is moved, t he manu al setup/h old value is also updated. The y always track each other . 3. When the manual setu ...

  • Agilent Technologies 16760A - page 163

    163 Chapter 5: Re ference The Sa mpling T ab An eye finder measurement is curr ently running. Stop the eye finder or wait for it to complete be fore running the eye finder . The eye finder is already run ning on the other machine de fined for this analyzer . Eye finder cannot run o n both machines at the same time. "Canno t ru n the Logic Ana ...

  • Agilent Technologies 16760A - page 164

    164 Chapter 5: Refer ence The Sa mpling T ab "From Eye Fin der: After h ardware calibra tion, the samp ling position s for the follow i ng channe ls may have shifted out of th e selected stable regi on by the amount shown: CHANNEL: AMOUNT ps ... (NNN more)" Each time a measurement is started, the hardware is re-calibrated. The new calibra ...

  • Agilent Technologies 16760A - page 165

    165 Chapter 5: Re ference The Sa mpling T ab request or when the Sampling Positi ons dialog is closed or iconified. "T imeout: < N K clocks in 5 sec" Eye finder requires sti m ulus at a minim um rate to perform its measurements. T oo few state cl ocks were seen in the time allotted. Check clock inp uts, clock definitio n, threshold vol ...

  • Agilent Technologies 16760A - page 166

    166 Chapter 5: Refer ence The Sa mpling T ab 2. The stable region(s) are too small for eye finder to dete ct. In this case y ou must re sort t o adjust ing th e sam ple posi tion ma nually a nd checking its validit y by r unning an ordinary analyzer me asureme nt to see i f the data value s you expect ar e sampled. Y ou can ad just the sample pos i ...

  • Agilent Technologies 16760A - page 167

    167 Chapter 5: Re ference The Sa mpling T ab than 5 nsec and the clock period is greater than 10 nsec (slower than 100 MHz ). Eye Finder Load/Save Messages. These messages can appe ar when saving or lo ading eye finder data . "... (at line XX in the f ile)" Indicates wher e the error occurred in the file being read. Since eye finder data ...

  • Agilent Technologies 16760A - page 168

    168 Chapter 5: Refer ence The Sa mpling T ab "Failed to open file for re ading/writi ng: NAME" The selected fi le could not be opened. Check access a nd file permissions. "File NA ME alread y exists. Overw rite?" The selected fi le exists. Answering "Y es" will cause the exist i ng contents of the file to be repl aced ...

  • Agilent Technologies 16760A - page 169

    169 Chapter 5: Re ference The Sa mpling T ab Eye Finder Setup T ab File m enu Lets you save /load eye finder data. EyeFinder menu Lets yo u run eye finder , choose the run mode, and access the “E ye Fi nder Advanc ed Se ttings Dia log” o n page 170. Run Mode Lets you l ook at ey e finder with demo data or in normal operat ing m ode by sam plin ...

  • Agilent Technologies 16760A - page 170

    170 Chapter 5: Refer ence The Sa mpling T ab channel will se lect it in each of thos e labels. See Also “Underst anding Stat e Mode Samplin g Position s” on page 2 56 “T o au tomatic ally a djust sa mpling position s” on pa ge 49 Eye Finder Advanced Settings Dialog. Short Eye finder looks at 100,000 clock cycles o n each channe l to d eterm ...

  • Agilent Technologies 16760A - page 171

    171 Chapter 5: Re ference The Sa mpling T ab • Data buses that are driven b y different ci rcuitry at diffe rent time s. When differ ent channels require different se t tings, yo u can run eye finder on channel subsets to avoid usi n g the Long setting o n a large number of chan nels. File Info T ab When the Eye Fi nder option is sele c ted, the ...

  • Agilent Technologies 16760A - page 172

    172 Chapter 5: Refer ence The Sa mpling T ab Relo ad Reloads ey e finder data from the name d file, dele ting unsaved change s. Save Saves cu rrent eye finder da ta to the named fi le. Save As... Saves current eye fin der data to a new file. See Also “T o au tomatic ally a djust sa mpling position s” on pa ge 49 Eye Scan Mode When you se lect E ...

  • Agilent Technologies 16760A - page 173

    173 Chapter 5: Re ference The Sa mpling T ab See Also “Sele cting t he Eye Scan Mode ” on page 55 “Underst anding Eye Scan Measureme nts” on page 25 9 ...

  • Agilent Technologies 16760A - page 174

    174 Chapter 5: Refer ence The Forma t T ab The Format T a b The Format tab is used to assign bus and signal names (from the device under test), to logic analyzer channels. T hese names are called labels . Labels are also used when setting up trigge rs and displaying captured data. The Format t ab also lets you assign pods to the logic anal yzer and ...

  • Agilent Technologies 16760A - page 175

    175 Chapter 5: Re ference The Format T ab Pod Assignment Dialog Name: Let s you nam e the ana lyzer. Ty p e : Lets yo u select the ti ming (asynch ronous) samp ling mode, the sta te (s ynchron ous) sampl ing m ode, o r turn the analyzer of f. Pods Can be dragged -and-droppe d under the analy zer to assign those channe ls to the analyzer or can be l ...

  • Agilent Technologies 16760A - page 176

    176 Chapter 5: Refer ence The T rigger T ab The T rigger T ab The T rigger tab i s used to tell the analyzer when to capture data. T he key event is the trigger . In the Agi lent T echnologies 16 760A logic analyzer , you can insert multiple t rigger actions. When you insert mul tiple trigger actio ns, the trigger marker in the display windows is p ...

  • Agilent Technologies 16760A - page 177

    177 Chapter 5: Re ference The T rigger T ab See Also “Underst anding Lo gic Analyzer T ri ggering ” on page 240 “Settin g Up T ri ggers and Running Measureme nts” on page 69 “Editi ng the T ri gger Se quen ce (Timing or 20 0, 400 Mb/s Sta te On ly)” on page 78 T rigger Functions Subtab T rigger functions provi de a simple way to set up ...

  • Agilent Technologies 16760A - page 178

    178 Chapter 5: Refer ence The T rigger T ab See Also • “Usin g T rigg er Funct ions” on page 70 • “Editing Adva nced T rigge r Functions (Timing or 200 Mb/ s State Only)” o n page 83 General T iming T rigger Funct ions When the t iming sampl ing mode is select ed, the following Gene ral Ti m i n g trigger function s are found in the T r ...

  • Agilent Technologies 16760A - page 179

    179 Chapter 5: Re ference The T rigger T ab maximum width specifications. • Find Nth occurren ce of an edge Beco mes true when the specif ied edge occur s in the sp ecifi ed numb er of samp les. • Find p attern p resent/abs ent for > duratio n Becom es true w hen the spe cifie d patter n is prese nt or abse nt for gr eater than the amount of ...

  • Agilent Technologies 16760A - page 180

    180 Chapter 5: Refer ence The T rigger T ab • W ait for arm in When the logic anal yzer is a rmed by an oth er ins trume nt (a s sp ecif ied in the I ntermodu le window), this t rigger functio n becomes t rue w hen the arm signal is received. • W ait fo r fla g Become s true when the speci fied flag has the specified v alue . This tr igger func ...

  • Agilent Technologies 16760A - page 181

    181 Chapter 5: Re ference The T rigger T ab Y ou can expand these trigge r functions to see how they are constructed with th e underlying advanced trigger functions. Y ou can break down these trig ger functions to directly edi t the underlying ad va nced t rigger funct ions. Some t imes you need to bre ak down a trigger function in order to add oth ...

  • Agilent Technologies 16760A - page 182

    182 Chapter 5: Refer ence The T rigger T ab Become s true when the secon d specifie d patter n occurs in a sample (even t uall y) a fter a sample in whic h the first specif ied pattern occurs. • Find pa ttern2 occur ring t oo soon af ter patt ern1 Becomes true when the second specified pattern occur s within a specified time after th e first spe ...

  • Agilent Technologies 16760A - page 183

    183 Chapter 5: Re ference The T rigger T ab When the logic anal yzer is a rmed by an oth er ins trume nt (a s sp ecif ied in the I ntermodu le window), this t rigger functio n becomes t rue w hen the arm signal is received. • W ait fo r fla g Become s true when the speci fied flag has the specified v alue . This tr igger function te sts for a fla ...

  • Agilent Technologies 16760A - page 184

    184 Chapter 5: Refer ence The T rigger T ab are true, it e xecutes t he actions after "t hen". • Advanced - 2-way branch This tri gger fu nction has two branches, of the f orm "If - the n; else if - then ". For each sample, the events in the first "If" branch are checke d. If all even ts are tr ue, the "then&quo ...

  • Agilent Technologies 16760A - page 185

    185 Chapter 5: Re ference The T rigger T ab • Advanced - patte rn1 OR pattern 2 Finds either patte rn1 or pattern2 or both in a sample . If you set it t o loo k for more th an 1 o ccurrence, you can spec ify whether the occurr ences are consec utive or not . Y ou can also add other ev ents, incl uding labels , to be searched f or . See Also “Ed ...

  • Agilent Technologies 16760A - page 186

    186 Chapter 5: Refer ence The T rigger T ab Y ou can use the following ty pes of events in these trig ger functions: patterns, ran ges, flags, and W ait for arm in (see “T o cross-tr igger with another instrument” on page 11 2). These trigger functions provide tri gger actions. Y ou cannot modify these actions or inser t any other actions. Only ...

  • Agilent Technologies 16760A - page 187

    187 Chapter 5: Re ference The T rigger T ab captured data . For maxi mum data capt ure the trigg er position should be set to end . A warnin g messa ge conc erning no trigge r actio n will be displa yed in the Run Status windo w . This w arning m essage can be ign ored si nce the inte nt of the trig ger functi on is not to trig ger . The run st atu ...

  • Agilent Technologies 16760A - page 188

    188 Chapter 5: Refer ence The T rigger T ab Sets up to n ever trigg er . Y o u mu st s elect t he s top bu tton to vi ew th e captured data . For maxi mum data capt ure the trigg er position should be set to end . A warnin g messa ge conc erning no trigge r actio n will be displa yed in the Run Status windo w . This w arning m essage can be ign ore ...

  • Agilent Technologies 16760A - page 189

    189 Chapter 5: Re ference The T rigger T ab trigge r arm ing, and c omp ensat e for t iming skew betw een modules. See Also “T o specif y the sample per iod” on page 45 “T o set acquisiti on memo ry depth” on page 53 “T o spe cify the trigge r positio n” on page 53 “T o co unt ti me, state s, or t urn co unting off” on page 75 “T ...

  • Agilent Technologies 16760A - page 190

    190 Chapter 5: Refer ence The T rigger T ab Default Storing Subtab Store by default Lets yo u spec ify tha t all eve nts ( Anything ), no events ( Nothing ), Custom (user defined ) events , or Tr a n s i t i o n s be stored by default. At st art of acquisition Lets yo u choos e wh ether defa ult s torin g is initi ally On or Off . Event specificati ...

  • Agilent Technologies 16760A - page 191

    191 Chapter 5: Re ference The T rigger T ab Status Subtab The Status subtab shows you the sequen ce level that is evaluating captured data, occurrence an d global counter values, and flag values. See Also “T o view the tri gger status ” on page 93 Save/Reca ll Subtab The Save/Recall subt ab lets you save trigge r setups within a session. The Ag ...

  • Agilent Technologies 16760A - page 192

    192 Chapter 5: Refer ence The T rigger T ab Y ou can also save trigger sequences outside o f configuration fi les by creating trig ger function libraries. See Also “Savin g/Recalling Trigger Setu ps” o n page 90 “Saving and Loading Lo gic Analyzer Configurati ons” on page 116 “T o create a trig ger function lib rary (timing or 200 Mb/s st ...

  • Agilent Technologies 16760A - page 193

    193 Chapter 5: Re ference The Sym bols T ab The Symbols T ab The Symbols tab lets you l oad symbol files or define your own symbols. Symbols are names for particular data val ues on a label. T wo kinds of symbols are avail ab le: • Obje ct File Symbo ls. These are sym bols from your so urce code and symbol s generated by your co mpiler . • Use ...

  • Agilent Technologies 16760A - page 194

    194 Chapter 5: Refer ence The Symb ols T ab Object fil e versions During the load process, a symbol database file with a .n s extension will be creat ed by the system. One .ns database file will be creat ed for each symbol file y o u load. On ce the .ns file is creat ed, the Sy mbol Utility wi ll use this file as its working symbol data base. The n ...

  • Agilent Technologies 16760A - page 195

    195 Chapter 5: Re ference The Sym bols T ab Symbols Selector Dialog Search Pa ttern: Lets you ente r partial symbol name s and the asteris k wildcard character (*) to limit the symbols to choose from (see “S earch Pattern” on page 196) . Use the Rec all button to select from previous search patterns . Find Symb ols of Ty p e Le ts you lim it th ...

  • Agilent Technologies 16760A - page 196

    196 Chapter 5: Refer ence The Symb ols T ab Of fset By Lets you add an offset value to the starting point of a symbol . This can be use f ul when c ompensating for micro proce ssor prefetch es ( see “Offset By O ptio n” on page 196). Align to Lets y o u mask t h e lower order bits of a symbol's va lue. This can be useful for triggering on ...

  • Agilent Technologies 16760A - page 197

    197 Chapter 5: Re ference The Sym bols T ab func1 and func2 are adjacent to each other in physical memory , with func2 following func1 . In or der to trigger o n fun c2 without getting a false trig ger from a prefetch beyond the e nd of f unc1 , you need to add an offset value to your label val ue. The offset value must be equal to or greater t han ...

  • Agilent Technologies 16760A - page 198

    198 Chapter 5: Refer ence The Symb ols T ab C++ notation. T o improve perf ormance for these ELF symbol files, type information is not associated with variables. H ence, some variables (typically a fe w local static variables) may not have the proper size associated with them. They may show a size of 1 byte and not the corre ct size of 4 bytes or e ...

  • Agilent Technologies 16760A - page 199

    199 Chapter 5: Re ference The Sym bols T ab The address or addr ess range must be a hexadecimal num ber . It must appear on the same l ine as the symbol name, and it must be separated from the symbol name by one o r more blank spaces or tabs. Address ranges must be i n the following format: beginning address..ending address The followin g example d ...

  • Agilent Technologies 16760A - page 200

    200 Chapter 5: Refer ence The Symb ols T ab [START ADDRESS] address #comment text Lines without a precedin g header are assumed to be symbol defini t ions in one of the [ V ARIABLES] formats. Examp l e This is an exam ple GP A file that contain s several different kinds of reco rds. [SECTIONS] prog 00001000..0000101F data 40002000..40009FFF common ...

  • Agilent Technologies 16760A - page 201

    201 Chapter 5: Re ference The Sym bols T ab NOTE: If you use section de finitio ns in a GP A symbol file, any subse quent fun ction or variab le defin ition s must be within th e addres s ranges of one of th e define d sections. Functions and variables that ar e not with in the range are ignored. Format [SECTIONS] section_name start..end attribute ...

  • Agilent Technologies 16760A - page 202

    202 Chapter 5: Refer ence The Symb ols T ab V ARIABLES Y ou can specify symbols fo r variables using: • The address of the variable. • The address and the size o f the variable. • The range of addresses occupied by the variable. If you specify only the addr ess of a variable, the size is assumed to be 1 byte. Format [VARIABLES] var_name start ...

  • Agilent Technologies 16760A - page 203

    203 Chapter 5: Re ference The Sym bols T ab Examp l e [SOURCE LINES] File: main.c 10 00001000 11 00001002 14 0000100A 22 0000101E See Also Using th e Source Vi ewer (see the Listing Display T ool help volu me) ST AR T ADDRESS Format [START ADDRESS] address address The addre ss of the pr ogram entr y poin t, i n hexad ecim al. Examp l e [START ADDRE ...

  • Agilent Technologies 16760A - page 204

    204 Chapter 5: Refer ence The Eye Scan T ab The Eye Scan T ab The Eye Scan tab is used to set up and run eye scan measurem ents. • “Labe ls Subtab” on page 2 04 • “Scan Setti ngs Subtab” on page 205 • “Advanced Subtab” on pag e 206 • “Qual ifie r Subta b” on pa ge 20 8 • “Comments Sub tab” on page 209 See Also “Sele ...

  • Agilent Technologies 16760A - page 205

    205 Chapter 5: Re ference The Eye Sc an T ab Sele ct None De-selects all channels. See Also “T o select chann els for the eye scan” on pag e 119 Scan Settings Subtab Scan Ra nge Lets you choose fr om Coar se , Medium , or Fine time and volta ge sett ings . The Default butto n returns to th e defa ults for the select ed scan range option. Ti m e ...

  • Agilent Technologies 16760A - page 206

    206 Chapter 5: Refer ence The Eye Scan T ab normal ope rating mode by sampl ing signals fro m the device under test. See Also “T o set the eye scan r ange and resoluti on” on p age 120 Advanced Subtab Eye scan measurements look at selected l o gic analyzer channels for signals passing thr o ugh small windows of time and voltage. Advanced optio ...

  • Agilent Technologies 16760A - page 207

    207 Chapter 5: Re ference The Eye Sc an T ab and o ther anomal ies w ill b e dis playe d if pr esen t. Short Proce sses fewer clocks at each scan poi nt. This setting requir es freq uent tra nsitions on a ll channe ls. Mediu m Processes a moderate number of clocks at each scan po int. Use this for channel s transition at a normal rate. Long Process ...

  • Agilent Technologies 16760A - page 208

    208 Chapter 5: Refer ence The Eye Scan T ab Qualifier Subt ab Qua lif icat ion Leve l Select th e button that describe s the state in which you want Eye Scan to col lect data. Clock E d ge to Sampl e Qua lifie r Le vel Qual ified eye scans may only be pe rformed wit h double edge cloc ks. Use Clock Ed ge to Sample Qualifier Level setti ng to specif ...

  • Agilent Technologies 16760A - page 209

    209 Chapter 5: Re ference The Eye Sc an T ab Comments Subtab Y ou can enter your comments on t he eye scan settings. When t he logic analyzer configu ration is saved, comments are saved along with the eye scan settings. See Also “T o comment on th e eye scan settin gs” on page 132 ...

  • Agilent Technologies 16760A - page 210

    210 Chapter 5: Refer ence The Calibr ation T ab The Calibration T a b All 16760A log ic analyzer cards m ust be calibrated to ensur e conformance to specifications. Calibrat ion Inst ructio ns Follow these instructions to calibrat e 16760A logic analyzer cards. The Cance l butt on exi ts the cal ibrat ion pro cedu re. Calibrat ion Status Di splay s ...

  • Agilent Technologies 16760A - page 211

    211 Chapter 5: Re ference Error Messages Error Me ssages • “Analyzer armed from another module contains no "Arm in from IMB" event ” on page 21 2 • “Branch expression is too complex” on page 212 • “Cannot sp ecify rang e on la bel with cl ock bits that span pod p airs” on page 217 • “Counter value checked as an event ...

  • Agilent Technologies 16760A - page 212

    212 Chapter 5: Refer ence Error Messa ges Analyzer armed from another modul e contains no "Arm in from IMB" event This warning i s displayed when a 16715 A and newer analyze r machine is in the gro up run arming tree, arm ed from another module ( not directly fro m the group r un), and no sequencer event li st in the analyzer con tains an ...

  • Agilent Technologies 16760A - page 213

    213 Chapter 5: Re ference Error Messages NOTE: For labe ls that do span pod pairs, t he comp lexit y can be re duced to th e same as tha t of the non- split la bel ca se if all b its in th e labe l on all b ut one pod pai r can be set to Xs in th e event list exp ression fo r the measure ment. For exam ple, if label ADD R has its 1 6 most sig nific ...

  • Agilent Technologies 16760A - page 214

    214 Chapter 5: Refer ence Error Messa ges • Canno t AND more than 16 non- split pa ttern ev ents if th e patte rn even ts are al l on the same pod pa ir . • Can AND up to 160 non- split patt ern events if the pat tern events a re evenly distribute d across all 10 pod pairs on a 5 card set (16 pattern even ts per pod pair). Specific Guidelines - ...

  • Agilent Technologies 16760A - page 215

    215 Chapter 5: Re ference Error Messages 1 If (complex event list) occurs 1 time then goto next 2 If anything occurs 1 time then Goto Next 3 If (complex event list) occurs 1 time then Trigger and fill memory • In 400 Mb/s State Modes, the trig ger sequence compiler must always add some addi tional compl exity to the com piled expressio n for the ...

  • Agilent Technologies 16760A - page 216

    216 Chapter 5: Refer ence Error Messa ges Specific Guidelines - 800 Mb/s State Mode • Lab els that span pods (split labels) requ ire more combiner reso urces than labels with bits th at all be long to a si ngle pod. Wheneve r possibl e, define labels that do not span pods. In some cases, the compiler will be able to comb ine 2 non- split l abels ...

  • Agilent Technologies 16760A - page 217

    217 Chapter 5: Re ference Error Messages comb ine 2 non- split l abels tha t are AN Ded toge ther even thou gh it fai ls to compile a pattern on a singl e label that spans pods. • Cannot spe cify more tha n 3 pattern s or 1 range per po d. Non-split patterns may use operations: =, !=, <, <=,>, >=, In ra nge, Not in r ange. Split patte ...

  • Agilent Technologies 16760A - page 218

    218 Chapter 5: Refer ence Error Messa ges Counter value checked as an e vent, but no increment action specified This warning occurs b ecause you have used a counter in your trig ger sequence , but do not have Counter Inc rement as an action. Y ou do not need to incremen t the counter in the same sequence level. The counter event will st ill functi ...

  • Agilent Technologies 16760A - page 219

    219 Chapter 5: Re ference Error Messages Maximum of 32 Channels Per Label The logic analyz er can only assign up to 32 channels for each label . If you need mo re than 32 channels, assign them to two labels and use the labels in conjunction. Must assign anoth e r pod pair to specify actions for flags In state sampling mode, when there is only o ne ...

  • Agilent Technologies 16760A - page 220

    220 Chapter 5: Refer ence Error Messa ges Possible Solutio ns • Phras e some of th e edges as patte rns. For exam ple, if you are loo king fo r a rising edge o n a read/w rite li ne, you can check for R/W = 0 in o ne lev el foll owed by R/W = 1 in the ne xt leve l. • Mov e some of th e edges to anoth er pod pair . Even if a label spans pod pa i ...

  • Agilent Technologies 16760A - page 221

    221 Chapter 5: Re ference Error Messages No T rigger action fo und in the trace specificati on This warning o ccurs when the trigger se q uence you spe cified does not have at least one trigger an d fill memory or trig ger and goto action. The analyzer will still acquire data, but you will ne ed to manually stop it. For example, when you use t he R ...

  • Agilent Technologies 16760A - page 222

    222 Chapter 5: Refer ence Error Messa ges The clock's thres hold level is set by t he po d thres hold. For t he log ic analyzer's J clock, che ck the pod thresho ld of pod 1 of the master car d . T imer value c hecked as an event, but no start action specifi ed This warning occurs b ecause you have used a timer in your trig ger sequence , ...

  • Agilent Technologies 16760A - page 223

    223 Chapter 5: Re ference Error Messages When you insert a trigger fun ction, the logi c analyz er sets up a field for you to ente r values . The fiel d length is ba sed on the num ber of bi ts assigne d to the fir st ac tive labe l, or the label you spec ify . If th ere ar e no bits assig ned to the label, the logic analyzer cannot complete the va ...

  • Agilent Technologies 16760A - page 224

    224 Chapter 5: Refer ence Error Messa ges The analyze r has a maximum lim it of 16 event list combiner reso urces. Each unique event list expression requir es the use of at least one of these combi ner resources. A complex event li st may re quire more t han one combiner resource. The message does n o t mean that any single event list expressio n w ...

  • Agilent Technologies 16760A - page 225

    225 Chapter 5: Re ference Error Messages • Event lists with up t o 4 u niqu e patter n eve nts can be com bined in an y combi nation of ANDs and ORs by a sin gle combiner reso urce if all of the pattern labels are no n-spli t and contained on the same pod pa ir . Comb ining more tha n 4 labels on t he s ame pod p air wi ll requir e ano ther comb ...

  • Agilent Technologies 16760A - page 226

    226 Chapter 5: Refer ence Error Messa ges fetch at an address that is not properly aligne d, the trigger will ne ver be found. • T rigg er set inc orrect ly Some stra tegies you can use when verifying or debugging trigger sequence levels ar e: • Look at th e run sta tus message li ne or open the Run Sta tus window . It will tell yo u wha t leve ...

  • Agilent Technologies 16760A - page 227

    227 Chapter 5: Re ference Specifica tions and Charac teristics Specifications and Characteristics NOTE: For a complete comparison of all logic analyzer specificatio ns and characterist ics refer to the Agilent T echnologies 167 00 Series Lo gic Analysis System Product Overview whi ch can be downloaded from the 16760A produ ct page on the Ag ilent w ...

  • Agilent Technologies 16760A - page 228

    228 Chapter 5: Refer ence Specificatio ns and Characteristic s E5378A Single-Ended Probe Specifications and Characteri stics NOTE: All sp ecifi catio ns are ma rked by " *" (ast erisk ). Input resistance and capacitance: (re fer to figure below) Maximum state data rate supported: 125 0 Mb/s Mating connector: Agi lent part # 1253-3620 (see ...

  • Agilent Technologies 16760A - page 229

    229 Chapter 5: Re ference Specifica tions and Charac teristics Maximum state data rate supported: 125 0 Mb/s Mating connector: Agi lent part # 1253-3620 (see note 1) Minimum voltage swing: Vpo s - Vneg >= 200 mV p-p Input dynamic range: -3. 0 Vdc to +5 Vdc Threshold accuracy: +/- (30 mV +1% of setting) (see note 4) Threshold range: -3. 0 V to +5 ...

  • Agilent Technologies 16760A - page 230

    230 Chapter 5: Refer ence Specificatio ns and Characteristic s Maximum input slew rate: 5 V /ns Clock input: Sin gle-ended Number of inputs (see note 5): 34 (32 data and 2 clock) Note 2: A kit containing 5 AMP MICTOR con nectors and 5 support shrouds is available, A gilent part # E5346-68701. A support shroud is available separately, Agilent part # ...

  • Agilent Technologies 16760A - page 231

    231 Chapter 5: Re ference Specifica tions and Charac teristics Data in to BNC port out: 150 ns Flag set/reset to evaluation: N/A Note 1: In the 1500 Mb/s mode, only the e ven-numbered channels (0,2,4,...etc.) are acqu ired. Note 2: The resolution of the hardware us ed to assign time tags is 4 ns. Times of inte rmediate states are calculated. 1250 M ...

  • Agilent Technologies 16760A - page 232

    232 Chapter 5: Refer ence Specificatio ns and Characteristic s 800 Mb/s Sampling Mode Speci fications and Characteri stics NOTE: All sp ecifi catio ns are ma rked by " *" (ast erisk ). Maximum data rate: E5378A, E5379A probes: 800 Mb/s E5380A probe: 600 Mb/s Minimum clock interval (active edge to active edge)*: E5378A, E5379A probes: 1.2 ...

  • Agilent Technologies 16760A - page 233

    233 Chapter 5: Re ference Specifica tions and Charac teristics 400 Mb/s Sampling Mode Speci fications and Characteri stics NOTE: All sp ecifi catio ns a re ma rked by " *" (ast erisk ). Maximum data rate: 400 Mb/s Minimum clock interval (active edge to active edge)*: 2.5 ns Minimum state clock pulse width: 1.5 ns Clock periodicity: Per io ...

  • Agilent Technologies 16760A - page 234

    234 Chapter 5: Refer ence Specificatio ns and Characteristic s 200 Mb/s Sampling Mode Speci fications and Characteri stics NOTE: All sp ecifi catio ns are ma rked by " *" (ast erisk ). Maximum data rate: 200 Mb/s Minimum clock interval (active edge to active edge)*: 5 n s Minimum state clock pulse width: 1.5 ns Clock periodicity: Per iodi ...

  • Agilent Technologies 16760A - page 235

    235 Chapter 5: Re ference Specifica tions and Charac teristics Conventional T iming Mode Specifications a nd Characteri stics NOTE: All sp ecifi catio ns a re ma rked by " *" (ast erisk ). Maximum timing analysis sample rate: Full channels: 400 MHz Half channels: 800 MHz Number of channels: 34 x (number of modules) Maximum channels on a s ...

  • Agilent Technologies 16760A - page 236

    236 Chapter 5: Refer ence Specificatio ns and Characteristic s Time interval accuracy: +/- [sample period + (chan-to-chan skew) + (0.01% of time interval)] Minimum data pulse width: 3.7 ns, 5.0 ns for trigger sequencing Maximum trigger sequencer speed: 200 MHz Trigger resources: 16 patterns (=,/=,<,>,<=,>=), 15 ranges (in range, not in ...

  • Agilent Technologies 16760A - page 237

    237 Chapter 5: Re ference Specifica tions and Charac teristics referred to as an "operational accuracy calibration". What is a Ch aracteristic? Characteristics describe p r oduct perf ormance that is useful in t he application of the product, but that is not covered by t he product warranty . Characteristics describe performance that is t ...

  • Agilent Technologies 16760A - page 238

    238 Chapter 5: Refer ence Specificatio ns and Characteristic s ...

  • Agilent Technologies 16760A - page 239

    239 6 Concepts • “Underst anding Lo gic Analyzer T ri ggering ” on page 240 • “Underst anding Stat e Mode Sampl ing Posit ions” on page 2 56 • “Underst anding Eye Scan Measureme nts” on page 25 9 ...

  • Agilent Technologies 16760A - page 240

    240 Chapter 6: C oncepts Underst anding Logic An alyzer T riggering Understanding Logic Analyzer T riggering Setting up l ogic analyzer triggers c an be di fficult and time-consuming. Y ou could assume that if you know how to program, you should be able to set up a logic analyzer tri gger with no diffi culty . However , this is not true because the ...

  • Agilent Technologies 16760A - page 241

    241 Chapt er 6: Concepts Underst anding Logic Analyze r T rigger i ng placed on the co nveyor belt, and at the other end the boxes fall off. In other words, because logic analyzer mem o ry is lim ited in depth (number of samples), whenever a new sample is acquired the oldest sample curren t ly in memory is thrown away if the memory is ful l. This i ...

  • Agilent Technologies 16760A - page 242

    242 Chapter 6: C oncepts Underst anding Logic An alyzer T riggering Special box Trigger point --------------------- ---------------- -------------- Next: “Summar y of T riggering Capabilities” on page 242 Summary of T riggering C apabilities Because logic analyze r triggering provid es a great deal of functionality , the following table provide ...

  • Agilent Technologies 16760A - page 243

    243 Chapt er 6: Concepts Underst anding Logic Analyze r T rigger i ng edge before it begins looking for the n ext rising ed ge. Because there is a sequence of st eps to find t he trigger , this is known as a trigg er sequence . Each step of the sequence is called a sequence level . Each sequence l evel consists of two parts; the con ditions and the ...

  • Agilent Technologies 16760A - page 244

    244 Chapter 6: C oncepts Underst anding Logic An alyzer T riggering time. T wo sequence levels can never be used t o specify tw o events that happen simultaneously . For example, consider the following trigger sequence: 1. If ADDR = 1000 then Go to 2 2. If DATA = 2000 then Trigger If the fol lowing samples were acquired, the logic analyzer would tr ...

  • Agilent Technologies 16760A - page 245

    245 Chapt er 6: Concepts Underst anding Logic Analyze r T rigger i ng analyzer will never trigger . When the condi t ions are m et in a sequence level, i t is clear whi ch sequence level will be executed next when a “Go T o” action is used, but it is no t necessarily clear if there is no “Go T o”. On some lo gic analyzers, i f there is no ? ...

  • Agilent Technologies 16760A - page 246

    246 Chapter 6: C oncepts Underst anding Logic An alyzer T riggering Branches Branches are similar to the Switch statem ent in the C progr amming language and the Selec t Cas e statement in Basic. They provide a method for testing multiple condit ions. Each branch has its own actions. An example of multiple branches is shown belo w: 1. If ADDR < ...

  • Agilent Technologies 16760A - page 247

    247 Chapt er 6: Concepts Underst anding Logic Analyze r T rigger i ng “not in rang e” function as well. Ranges are a convenient sho rtcut so that you don't have to specify “ADDR >= 1000 and ADDR <= 2000”. Next: “Flags” on page 247 Flags Flags are Boolean var iables that are used to send signals from one module to another . Th ...

  • Agilent Technologies 16760A - page 248

    248 Chapter 6: C oncepts Underst anding Logic An alyzer T riggering be used in place of Global Coun t ers, if possible , b ecause they are easi er to use and because ther e is a limited number of Global Counters. Next: “T imers” on page 248 Ti m e r s T imers are used to check the amount of time that has elapsed between events. Fo r example, if ...

  • Agilent Technologies 16760A - page 249

    249 Chapt er 6: Concepts Underst anding Logic Analyze r T rigger i ng because timer 1 will keep running and cond ition “T imer1 <500 ns” wi ll never be met. There might be another rising edge o n SIG1 that is followed wi t hin 500ns by t he rising edge on SIG 2 that occurs l ater on, so this situation is unacceptable. T o fix this problem, w ...

  • Agilent Technologies 16760A - page 250

    250 Chapter 6: C oncepts Underst anding Logic An alyzer T riggering ADDR In Range 1000 to 2000 By default, the Default Sto r age is set to stor e all samples acquired. Y ou can also set the Default Storage to store nothing, which means that no samples will be stored unl ess a sequence level overrides the def ault storage. Sequen ce Level Storag e S ...

  • Agilent Technologies 16760A - page 251

    251 Chapt er 6: Concepts Underst anding Logic Analyze r T rigger i ng 1. If DATA = 005E then Trigger Else If ADDR in range 5000 to 6FFF then Store Sample Go to 1 Else If ADDR not in range 5000 to 6FFF then Don't Store Sample Go to 1 Alternatively , if t he default storage is set to “Store Every t hing”, use the following: 1. If DATA = 005E ...

  • Agilent Technologies 16760A - page 252

    252 Chapter 6: C oncepts Underst anding Logic An alyzer T riggering The Agilent 16715A trigger user inter face Note that a picture (which corresponds to the selected function) is provided t o the ri ght of the trigger function list. For example, if you want to tr igger when a bus pat tern is immediately followed by another bus pattern, you can use ...

  • Agilent Technologies 16760A - page 253

    253 Chapt er 6: Concepts Underst anding Logic Analyze r T rigger i ng The same tri gger as If/Then st atements T rigger functions can be m o dified. For example, if you start with the function “ Find Edge”, you can add anothe r event, and it becomes the same as “Find Ed ge and Pattern”. Therefore, a function that i s not exactly correct can ...

  • Agilent Technologies 16760A - page 254

    254 Chapter 6: C oncepts Underst anding Logic An alyzer T riggering “Find E dge” and “Find Pattern” tog ether Next: “Set t ing U p Complex T riggers” on page 25 4 Sett ing Up Compl ex T riggers Frequently , the most difficult p art of setting up a complex trigger is breaking do w n the proble m. In other words, how do you map a complex ...

  • Agilent Technologies 16760A - page 255

    255 Chapt er 6: Concepts Underst anding Logic Analyze r T rigger i ng different parts o f the trigger to describe how they work. Inline documentatio n on an Agi lent logic a nalyzer Next: “Conclusions” on page 255 Conclusi ons Setting up l ogic analyzer triggers i s very different than wri t ing software. The job can be greatly simpl ified if o ...

  • Agilent Technologies 16760A - page 256

    256 Chapter 6: C oncepts Unde rstan ding St ate Mode Sampli ng Posi tion s Understanding State Mode Sampling Positions Synchronous sam pling (state mode) l ogic analyzers are like edge- triggered fl ip-flops in that the y require input logic sign als to be stable for a period of time before the clock event (setup time) and after the clock event (ho ...

  • Agilent Technologies 16760A - page 257

    257 Chapt er 6: Concepts Underst anding Stat e Mode Sa m pli ng Positions T o position the setup/hold wind ow (sampling position) wi t hin the data valid window , a logic analyzer has an adjustable delay on each sampling clock input (to position the setup/hold window f or all the channels in a pod). Sample Position Adjustment s on Indiv idual Cha n ...

  • Agilent Technologies 16760A - page 258

    258 Chapter 6: C oncepts Unde rstan ding St ate Mode Sampli ng Posi tion s channel in a small fraction of the time (and without the extra test equipment) that it takes to make the adjustments manually . Eye finder is an easy way t o get t he smallest possible logic analyzer setup/hold window . See Also “T o au tomatic ally a djust sa mpling posit ...

  • Agilent Technologies 16760A - page 259

    259 Chapt er 6: Concepts Unde rstanding Eye Scan Mea surements Understanding Eye Scan Measurements Eye scan measurement s are made possible by the lo gic analyzer's ability to double -sample each channel using sli ghtly offset delays and by comparing the delayed samples using an exclusive-OR operatio n. When the exclusive- OR output is high, t ...

  • Agilent Technologies 16760A - page 260

    260 Chapter 6: C oncepts Underst anding Eye Scan Measureme nts The result is a map of transitions detected in small windows of time and voltage over a r ange of time and voltage. Oscilloscope- like eye diagrams are used to display the m e asurement d ata. The number of transitions in each window is indicated by brig htness or color . When setting u ...

  • Agilent Technologies 16760A - page 261

    261 Chapt er 6: Concepts Unde rstanding Eye Scan Mea surements Fine settings result i n higher eye diagram resolution, but because more samples are colle c ted, m easurements take longer to run. The picture below is an e x ample of measur ement results when the fine settings are used. ...

  • Agilent Technologies 16760A - page 262

    262 Chapter 6: C oncepts Underst anding Eye Scan Measureme nts The smallest time resolution that can be set i s 10 ps. The smallest voltage resolution that can be set is 1 mV . The number of channels on which an eye scan measurement collects data also aff ects the measurement time. The e x ception is when there are mult iple logic analyzer cards in ...

  • Agilent Technologies 16760A - page 263

    263 Glossar y absolute D enotes th e time peri od or count of states between a captured state a nd the trigger state . An absolute count of -10 indicat es the state was c aptured ten states before the trigge r state was capture d. acquisition Denote s one compl ete cycl e of data gather ing by a measur ement m odule . For ex ample, if yo u are usin ...

  • Agilent Technologies 16760A - page 264

    264 Glossary pointing device, to cl ick an ite m, posi tion the curs o r over the item. Then quickl y press a nd releas e the left m ouse butto n . clock cha nnel A l ogic analyzer channel that can be used to carry the clock signal. When it is not needed for clock signals, it can be used as a data channel , except i n the Agil ent T echnolog ies 16 ...

  • Agilent Technologies 16760A - page 265

    265 Glossary inst rument tool . Multi ple da ta s ets can be di splay ed togeth er wh en sourced in to a single displa y tool. Th e Filter tool i s used to pass o n parti a l data sets to a nalysis o r dis play tools . debug m ode See mo nito r . dela y The dela y function se ts the horizontal positi on of the waveform on the s creen for the oscill ...

  • Agilent Technologies 16760A - page 266

    266 Glossary Using th e T ouchscr een: Posit ion your fin ger over the item, then press and hol d finger to the scre en. While holdin g the finger down, sl ide the fi nger al ong the screen draggi ng the item to a new loca tion. Wh en the item is posit ioned where you wan t it, re leas e your finger . edge mo de I n an osci llos cope, this is the t ...

  • Agilent Technologies 16760A - page 267

    267 Glossary logic analyze r what data y ou want to collect, such as which ch annels represent bu ses (labels) and what logi c thres hold you r sign als use . frame The Agilen t T echno logies or 16700A/B-ser ies logic analys is syste m mainfr ame. See als o logic analysis system . gate way a ddress An IP addr ess entere d in integ er dot notatio n ...

  • Agilent Technologies 16760A - page 268

    268 Glossary is usu ally repr esen ted as dec imal numbers separated b y periods; for example, 192.35.12 .6. Ask your LAN adminis trator if you ne ed an inter net address. labels Labels are used to group and iden tify logi c anal yzer c hanne ls. A labe l con sists o f a na me and an associated bit or gro up of bits. Labels are c reated in the Form ...

  • Agilent Technologies 16760A - page 269

    269 Glossary machine becau se th e master car d is in slo t C of the ma infram e. The ot her cards of the modul e are called expansion car ds . menu bar T he menu ba r is locat ed at the top of a ll window s. Use it to select File ope rations, tool or sys tem Options , and t ool o r sy stem leve l Help . message bar The message b ar display s mouse ...

  • Agilent Technologies 16760A - page 270

    270 Glossary by the channel width of the instr ument. pod See pod p air point T o point to an item , move the mous e cur sor o ver t he i tem, or posi tion your finger over the i tem. preprocesso r See analy sis probe . primary br anch The pr imar y branch is indicated in the T r igger sequence step dialog box as either the Th en find or T rigge r ...

  • Agilent Technologies 16760A - page 271

    271 Glossary measurem ent as part of it s data acquisition cycle. Sampl ing Use the se lections u nder the lo gic anal yzer S ampli ng tab to tell the logic analyzer how yo u want to make measurements, such as State vs. T iming . second ary branch The secondary branch is indicated in the T r igger sequence step dialog box as the Els e on selec tion ...

  • Agilent Technologies 16760A - page 272

    272 Glossary symbols Symbol s represen t patterns and ra nges of values f ound on labeled se ts of bits. T wo kinds of symbols are available: • Obje ct file symbo ls - Symb ols from your source code, and symbol s generated by your compil er . Object file symbo ls may repres ent gl obal vari able s, functi ons, labe ls, and source l ine numbe rs. ...

  • Agilent Technologies 16760A - page 273

    273 Glossary timing measur e ment In a tim ing measurement, the logic analy zer samp les dat a at regul ar in terval s according to a clock signal inter nal to the t iming analy zer . Sinc e the analyzer is clocked by a signal that is not relate d to the sy stem und er test, timing meas urements capture traces of ele ctrica l activ ity o ver tim e. ...

  • Agilent Technologies 16760A - page 274

    274 Glossary field . This action allo ws you to select spec ific por tions of a partic ular waveform in acquisition memory that will be displa yed on the s creen. Y ou can view any porti on of the waveform record in acquis ition memory . ...

  • Agilent Technologies 16760A - page 275

    275 Symbols & , 84 *, bi t as signm ent , 60 +, label polarity , 64 -, label polarity , 64 ., bit unass ignment , 60 Numeri cs 1250 Mb /s / 128M Half Chan ne l configurati on , 47 1250 Mb /s state samplin g mode spec ificatio ns and characteristics , 231 1500 Mb /s / 128M Half Chan ne l configurati on , 47 1500 Mb/s / Eye Scan configurati on , ...

  • Agilent Technologies 16760A - page 276

    276 Index bit numbers of logic analy zer channels , 60 bit order , changing , 65 bit signif icance , 60 bits, r eordering , 65 boolean expres sions , 245 branches , 246 branches, trigger sequence , 80 break down trigge r functions , 83 , 251 breaking down a trigger function , 72 break i ng down t rigger functions , 70 browsing , 196 browsing the sy ...

  • Agilent Technologies 16760A - page 277

    Index 277 counter 2 value checked as an event, but no i ncrement action spec ified , 218 counter actions , 86 counter e vents , 86 counter warning me ssage , 218 counters, global , 86 counters, occurrence and global , 247 counti ng s tates , 75 counti ng s tates or ti me , 188 counti ng t ime , 75 cross-triggering , 112 cursor tool (eye scan displa ...

  • Agilent Technologies 16760A - page 278

    278 Index expo rtin g label defi nitions to an ASCII fi le , 64 expressions, boolean , 245 external ref erence (th reshold voltage) , 35 external refer ence threshold voltage , 58 eye fi nder , 46 , 49 , 16 9 , 256 eye fi nder advan ced sett ings , 170 eye fi nder dat a , 116 eye fi nder sel ected/s ugges ted sampling positions , 161 eye limi ts to ...

  • Agilent Technologies 16760A - page 279

    Index 279 Fin d patter n2 occ urri ng immediat ely after pat tern1 , 181 Find pa tter n2 occu rri ng too lat e after pa ttern1 , 182 Fin d patter n2 occ urr ing t oo soon after pa ttern1 , 182 Find t oo few st ates betw een pattern1 and patt e rn2 , 182 Find t oo many states between pattern1 and patt e rn2 , 182 Find wi dth violation on a pat tern/ ...

  • Agilent Technologies 16760A - page 280

    280 Index label pol arity , 64 label values , 71 label values, symbolic , 105 labels , 22 , 57 labels subtab, ey e scan , 204 labels, as signing ch annels t o , 60 lab els, assi gnin g to logic a nalyz er channels , 19 labels, re name/inser t/delete , 60 labels, reorderin g bits , 65 labels, turning off or on , 66 least si gnificant bit in l abel , ...

  • Agilent Technologies 16760A - page 281

    Index 281 posi tive l ogic , 64 pred efined t rigger func tions , 177 pref etch, trigg ering beyo nd , 196 preprocessors (analysis probes) , 41 presen t for > , 84 preserv ing b it ass ignment s , 66 previou s trig ger setu p, recall ing , 91 printi ng capture d data , 110 probing the device u nder test , 15 prob ing, an alysi s prob es , 41 pro ...

  • Agilent Technologies 16760A - page 282

    282 Index setting clock threshold voltages , 59 setting pod threshold voltages , 58 setting the advanced eye scan options , 12 1 settin g the eye scan range , 120 settin g the eye sc an resolut ion , 12 0 settings (eye scan), commenting on , 132 settings (eye scan), qual ified , 12 2 settings (trigger) , clearing , 83 settings, eye finder advanced ...

  • Agilent Technologies 16760A - page 283

    Index 283 symbols , loadi ng user -defin ed , 10 5 symbols, outside define d sections , 107 symbols, types and use , 19 3 symbols , user -d efined , 104 symbols, using , 101 synchronous sampli ng , 16 Syste m Performa nce Ana lysis toolset , 95 T tab, symbo ls , 193 then branch , 80 threshold re ference volt ages , 35 threshold voltages , 19 , 160 ...

  • Agilent Technologies 16760A - page 284

    284 Index triggers, strateg ies for setting up , 251 troubleshooting the logic analyzer , 114 turbo st ate trigger functio ns , 185 U una ssign ed bits , 60 unas signed po d requi red , 75 understanding logic analy zer trigg ering , 24 0 Undo co mmand , 72 ungrou ping even ts , 89 unloadin g trigger fu nction libra ries , 73 , 177 user de fined thr ...

  • Agilent Technologies 16760A - page 285

    P u b l i c a t i o n N u m b er : 5 98 8 -9044 EN s1 January 1, 2003 ...

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